Research on Optimisation Framework for AOI in Semiconductor Manufacturing Accepted for Presentation at the IEEE INDIN 2025

Our paper on “Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing” has been accepted for presentation at the prestigious 23rd IEEE International Conference on Industrial Informatics (INDIN) 2025, which will be held in July 2025 at Kunming, China. KTP Associate and first author of the paper, Shruthi Kogileru will be sharing the outcomes from this research with fellow experts in the field.

All the very best, Shruthi!